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Model Plan Apochromat objective ULWD PLAN APO 50X/0
additional eyepieces
(w/ Analysis Professional Software Suite) PA53MET-T PA53MET-BD PA53MET-BD-3D (w/ Analysis Professional Software Suite) PA53MET-BD-T Main Differences • Reflected Illumination
3 mm Objective coverglass thickness NCG Valid for PA53MET Series
For full freedom of illumination options
Panthera TEC MAT b series Model Plan Apochromat objective ULWDThe Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross Polarization contrast are combined with a new, unique to Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects
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