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SEMI M53 — Practice for Calibrating Scanning Surface Inspection Systems Using Depositions of Monodisperse Polystyrene Latex Sphere on Unpatterned Semiconductor Wafer Surfaces
SEMI E88-0304 (technical revision)
SEMI S22-0709 (technical revision)
Equipment users require the ability to track equipment performance without dependence on user input to eliminate inaccuracies due to incorrect or untimely input from the user
Risk assessments during SME development are a principal use of SEMI S10
E03500 - SEMI E35 - 半導体製造装置のCOO測定方法の計算ガイド StdPbc-0120 SEMI M53 — Practice forglobal Metrics Technical Committee20111224global Audits and Reviews Subcommittee20123www. semiviews. org www. semi. org199520073 COOcomprehensive cost of ownershipCOOconstrained cost of ownershipCOOmonitor cost of ownershipEHS ICFPDPVMEMSLEDHB LEDHDD COO COO Referenced SEMI Standards SEMI E10 Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) and Utilization SEMI E81 Provisional Specification